Электронная библиотека (репозиторий) Томского государственного университета
статьи в сборниках | 2016 | Matrosova, Anjela Yu.

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Add   Pseudo-exhaustive testing of sequential circuits for multiple stuck-at faults
Authors: Matrosova, Anjela Yu. | Mitrofanov, Evgenii V.
Source: Proceedings of IEEE East-West Design & Test Symposium (EWDTS'2016), Yerevan, Armenia, October 14-17, 2016. [S. l.], 2016. P. 533-536
Type: статьи в сборниках
Date: 2016
Add   ROBDD based path delay fault testable combinational circuit synthesis
Authors: Shah, Toral | Singh, Virendra | Matrosova, Anjela Yu.
Source: Proceedings of IEEE East-West Design & Test Symposium (EWDTS'2016), Yerevan, Armenia, October 14-17, 2016. [S. l.], 2016. P. 181-184
Type: статьи в сборниках
Date: 2016
Add   A fault-tolerant sequential circuit design for SAFs and PDFs soft errors
Authors: Matrosova, Anjela Yu. | Kirienko, I. E. | Nikolaeva, E. A. | Ostanin, S. A.
Source: 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS), 4-6 July 2016, Hotel Eden Roc, Sant Feliu de Guixols, Catalunya, Spain. [S. l.], 2016. P. [1-2]
Type: статьи в сборниках
Date: 2016
Add   A high performance scan flip-flop design for serial and mixed mode scan test
Authors: Ahlawat, Satyadev | Matrosova, Anjela Yu. | Singh, Virendra | Tudu, Jaynarayan
Source: 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS), 4-6 July 2016, Hotel Eden Roc, Sant Feliu de Guixols, Catalunya, Spain. [S. l.], 2016. P. 233-238
Type: статьи в сборниках
Date: 2016
Add   Patching circuit design based on reserved CLBs
Authors: Matrosova, Anjela Yu. | Ostanin, S. A. | Andreeva, V.
Source: 2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR), 19th - 21st May, Cluj-Napoca, Romania : proceedings. [S. l.], 2016. P. [1-5]
Type: статьи в сборниках
Date: 2016
Add   A fault-tolerant sequential circuit design for soft errors based on fault-secure circuit
Authors: Ostanin, S. A. | Butorina, Natalia Borisovna | Lavrov, V. A. | Matrosova, Anjela Yu.
Source: Proceedings of IEEE East-West Design & Test Symposium (EWDTS'2016), Yerevan, Armenia, October 14-17, 2016. [S. l.], 2016. P. 607-610
Type: статьи в сборниках
Date: 2016
Add   ROBDDS application for finding the shortest transfer sequence of sequential circuit or only revealing existence of this sequence without deriving the sequence itself
Authors: Matrosova, Anjela Yu. | Andreeva, V. | Melnikov, A. V.
Source: Proceedings of IEEE East-West Design & Test Symposium (EWDTS'2016), Yerevan, Armenia, October 14-17, 2016. [S. l.], 2016. P. 513-516
Type: статьи в сборниках
Date: 2016
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