A high performance scan flip-flop design for serial and mixed mode scan test

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DOI Доступ к ресурсу на сайте издателя			10.1109/IOLTS.2016.7604709

Title: A high performance scan flip-flop design for serial and mixed mode scan test
Creator: Ahlawat, Satyadev
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Matrosova, Anjela Yu.
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Singh, Virendra
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Tudu, Jaynarayan
Date: 2016
DOI: 10.1109/IOLTS.2016.7604709

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collection(s): Факультет прикладной математики и кибернетики (до 01.09.2017 г.)
Identifier: смотреть в электронном каталоге НБ ТГУ
Type: статьи в сборниках
Source: 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS), 4-6 July 2016, Hotel Eden Roc, Sant Feliu de Guixols, Catalunya, Spain. [S. l.], 2016. P. 233-238
Language: eng

Created: 02-11-2017

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