Электронная библиотека (репозиторий) Томского государственного университета
Mitrofanov, Evgenii V.

Add to Quick Collection   All 6 Results

Showing items 1 - 6 of 6.
  • «
  • 1
  • »
Sort:
 Add All Items to Quick Collection
Source: Вестник Томского государственного университета. Управление, вычислительная техника и информатика. 2018. № 42. С. 89-99
Type: статьи в журналах
Date: 2018
Description: Inserting malicious sub-circuits that may destroy a logical circuit or provide leakage of confidential information from a system containing the logical circuit demands detection of such sub-circuits f ... More
Source: Proceedings of 2017 IEEE East-West Design & Test Symposium (EWDTS), Novi Sad, Serbia, September 27 – October 2, 2017. [S. l.], 2017. P. 137-140
Type: статьи в сборниках
Date: 2017
Description: A technique of finding a set of sequential circuit
Source: 2017 European Conference on Circuit Theory and Design (ECCTD), September 4-6, 2017, Catania, Italy. [S. l.], 2017. P. [1-4]
Type: статьи в сборниках
Date: 2017
Description: Inserting malicious sub-circuits that may cause a
Source: Вестник Томского государственного университета. Управление, вычислительная техника и информатика. 2017. № 39. P. 85-93
Type: статьи в журналах
Date: 2017
Description: Fully delay testable circuits obtained by covering ROBDD nodes with Invert-AND-OR sub-circuits and Invert-ANDXOR sub-circuits implementing Shannon decomposition formula are considered. Algorithms of f ... More
Source: Proceedings of IEEE East-West Design & Test Symposium (EWDTS'2016), Yerevan, Armenia, October 14-17, 2016. [S. l.], 2016. P. 533-536
Type: статьи в сборниках
Date: 2016
Source: Proceedings of the 21st IEEE International On-Line Testing Symposium Symposium (IOLTS), 6-8 July 2015, Athena Pallas Village, Elia, Halkidiki, Greece. [S. l.], 2015. P. 44-45
Type: статьи в сборниках
Date: 2015
  • «
  • 1
  • »
^