Pseudo-exhaustive testing of sequential circuits for multiple stuck-at faults

Add to "Quick Collection"

Description	Size	Format
Pseudo-exhaustive testing of sequential circuits for multiple stuck-at faults	358 KB	Adobe Acrobat PDF	Read	Download

Title: Pseudo-exhaustive testing of sequential circuits for multiple stuck-at faults
Creator: Matrosova, Anjela Yu.
|
Mitrofanov, Evgenii V.
Date: 2016

Relationships: Show Relationship Browser for this Object
collection(s): Факультет прикладной математики и кибернетики (до 01.09.2017 г.)
Identifier: смотреть в электронном каталоге НБ ТГУ
Type: статьи в сборниках
Source: Proceedings of IEEE East-West Design & Test Symposium (EWDTS'2016), Yerevan, Armenia, October 14-17, 2016. [S. l.], 2016. P. 533-536
Language: eng

Created: 01-11-2017

885 Visitors

638 Hits

254 Downloads