Электронная библиотека (репозиторий) Томского государственного университета
эпитаксиальные пленки | статьи в журналах

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Add   Determination of the parameters of multi-carrier spectrum in CdHgTe. II. Discrete mobility spectrum analysis
Authors: Izhnin, Igor I. | Voytsekhovskiy, Alexander V. | Korotaev, Alexander G. | Mynbaev, Karim D.
Source: Russian physics journal. 2023. Vol. 65, № 10. P. 1716-1731
Type: статьи в журналах
Date: 2023
Description: The paper, which consists of two parts, considers in detail the method of discrete mobility spectrum analysis (DMSA) proposed by the authors as well as its application to determine the parameters of c ... More
Add   Hydrogen sensors based on Pt/α-Ga2O3:Sn/Pt structures
Authors: Almaev, Aleksei V. | Nikolaev, Vladimir I. | Yakovlev, Nikita N. | Butenko, Pavel N. | Stepanov, Sergey I. | Pechnikov, Aleksei I. | Scheglov, Mikhail P. | Chernikov, Evgeniy V.
Source: Sensors and actuators B : Chemical. 2022. Vol. 364. P. 131904 (1-9)
Type: статьи в журналах
Date: 2022
Description: Gas sensing properties of Schottky metal-semiconductor-metal (MSM) structures based on α-Ga2O3 epitaxial films with Pt contacts are investigated. The electrical conductivity of the MSM structures expo ... More
Add   Nano‑scale structural studies of defects in arsenic‑implanted n and p‑type HgCdTe films
Authors: Izhnin, Igor I. | Voytsekhovskiy, Alexander V. | Korotaev, Alexander G. | Mynbaev, Karim D. | Świątek, Zbigniew | Morgiel, Jerzy | Fitsych, Olena I. | Varavin, Vasilii S. | Marin, Denis V. | Yakushev, Maxim V. | Bonchyk, A. Yu. | Savytskyy, Hrygory V.
Source: Applied nanoscience. 2022. Vol. 12, № 3. P. 395-401
Type: статьи в журналах
Date: 2022
Description: Bright–feld and high-resolution transmission electron microscopy were used for nano-scale structural studies of defects induced by implantation of arsenic ions with 190 keV energy and 1014 cm–2 fuence ... More
Add   Analysis of carrier species in arsenic-implanted p- and n-type Hg0.7Cd0.3Te
Authors: Izhnin, Igor I. | Mynbaev, Karim D. | Voytsekhovskiy, Alexander V. | Korotaev, Alexander G. | Varavin, Vasilii S. | Dvoretsky, Sergei A. | Mikhailov, Nikolay N. | Yakushev, Maxim V. | Fitsych, Olena I. | Świątek, Zbigniew
Source: Infrared physics and technology. 2021. Vol. 114. P. 103665 (1-7)
Type: статьи в журналах
Date: 2021
Description: Carrier species in arsenic-implanted p– and n–type Hg0.7Cd0.3Te films grown by molecular-beam epitaxy were investigated with the use of the Hall-effect studies and mobility spectrum analysis. The impl ... More
Add   Effect of ambient humidity on the electrical conductivity of polymorphic Ga2O3 structures
Authors: Almaev, Aleksei V. | Nikolaev, Vladimir I. | Stepanov, Sergey I. | Yakovlev, Nikita N. | Pechnikov, Aleksei I. | Chernikov, Evgeniy V. | Kushnarev, Bogdan O.
Source: Semiconductors. 2021. Vol. 55, № 3. P. 346-353
Type: статьи в журналах
Date: 2021
Description: The effect of ambient humidity on the electrical conductivity of α-Ga2O3 and α-Ga2O3/ε-Ga2O3 is investigated. Polymorphic epitaxial Ga2O3 layers are deposited by the method of chloride vapor-phase epi ... More
Add   Влияние влажности окружающей среды на электрическую проводимость полиморфных Ga2O3-структур
Authors: Алмаев, Алексей Викторович | Николаев, Виктор Иванович | Степанов, Сергей Игоревич | Яковлев, Никита Николаевич | Печников, Алексей Игоревич | Черников, Евгений Викторович | Кушнарев, Богдан Олегович
Source: Физика и техника полупроводников. 2021. Т. 55, № 3. С. 269-276
Type: статьи в журналах
Date: 2021
Description: Исследовано влияние влажности окружающей среды на электрическую проводимость структур a-Ga2O3 и a-Ga2O3/"-Ga2O3. Полиморфные эпитаксиальные слои Ga2O3 осаждались методом хлоридной газофазной эпитаксии ... More
Add   Nano‑size defect layers in arsenic‑implanted and annealed HgCdTe epitaxial films studied with transmission electron microscopy
Authors: Izhnin, Igor I. | Mynbaev, Karim D. | Syvorotka, I. I. | Korotaev, Alexander G. | Voytsekhovskiy, Alexander V. | Fitsych, Olena I. | Varavin, Vasilii S. | Marin, Denis V. | Bonchyk, A. Yu. | Mikhailov, Nikolay N. | Yakushev, Maxim V. | Świątek, Zbigniew | Morgiel, Jerzy | Jakiela, Rafal | Savytskyy, Hrygory V.
Source: Applied nanoscience. 2020. Vol. 10, № 12. P. 4971-4976
Type: статьи в журналах
Date: 2020
Description: Optical reflectance and bright-field and high-resolution transmission electron microscopy studies of radiation damage induced
Add   The relaxation of electrophysical properties HgCdTe epitaxial films affected by plasma of high frequency nanosecond volume discharge in atmospheric-pressure air
Authors: Grigoryev, Denis V. | Voytsekhovskiy, Alexander V. | Lozovoy, Kirill A. | Tarasenko, Viktor Fedotovich | Ripenko, V. S. | Shulepov, Mikhail A. | Erofeev, Mikhail V. | Yakushev, Maxim V. | Dvoretsky, Sergei A. | Korotaev, Alexander G. | Mikhailov, Nikolay N. | Varavin, Vasilii S.
Source: Surface and coatings technology. 2020. Vol. 387. P. 125527 (1-5)
Type: статьи в журналах
Date: 2020
Description: In this work the results of the experimental investigation of the influence of the high-frequency nanosecond
Add   Electrical profiling of arsenic-implanted HgCdTe films performed with discrete mobility spectrum analysis
Authors: Syvorotka, I. I. | Fitsych, Olena I. | Varavin, Vasilii S. | Dvoretsky, Sergei A. | Marin, D. V. | Mikhailov, Nikolay N. | Remesnik, V. G. | Yakushev, Maxim V. | Mynbaev, Karim D. | Izhnin, Igor I. | Voytsekhovskiy, Alexander V. | Korotaev, A. G.
Source: Semiconductor science and technology. 2019. Vol. 34, № 3. P. 035009 (1-7)
Type: статьи в журналах
Date: 2019
Description: The results from the electrical profiling of an n-on-p junction formed by 190-keV arsenic ion implantation in an indium/vacancy–doped Hg0.78Cd0.22Te film are presented. Mobility spectrum analysis in c ... More
Add   Influence of composition of Hg1-xCdxTe(x = 0.22-0.57) epitaxial film on dynamics of accumulation and spatial distribution of electrically active radiation defects after boron implantation
Authors: Grigoryev, Denis V. | Korotaev, A. G. | Kokhanenko, Andrey P. | Lozovoy, Kirill A. | Izhnin, Igor I. | Savytskyy, Hrygory V. | Bonchyk, A. Yu. | Dvoretsky, Sergei A. | Mikhailov, Nikolay N. | Voytsekhovskiy, Alexander V. | Varavin, Vasilii S. | Yakushev, Maxim V.
Source: Materials research express. 2019. Vol. 6, № 7. P. 075912 (1-8)
Type: статьи в журналах
Date: 2019
Description: In this paper experimental results of research of boron ion implantation into Hg1−x Cd x Te epitaxial films of various compositions x are presented. Samples of epitaxial films were grown by the method ... More
Add   Вольт-амперные характеристики nBn-структур на основе эпитаксиальных пленок кадмий-ртуть-теллур
Authors: Несмелов, Сергей Николаевич | Дзядух, Станислав Михайлович | Дворецкий, Сергей Алексеевич | Михайлов, Николай Николаевич (физик) | Сидоров, Георгий Юрьевич | Войцеховский, Александр Васильевич
Source: Известия высших учебных заведений. Физика. 2019. Т. 62, № 6. С. 118-124
Type: статьи в журналах
Date: 2019
Description: Экспериментально исследованы вольт-амперные характеристики nBn- структур на основе HgCdTe, выращенного методом молекулярно-лучевой эпитаксии (МЛЭ) на подложках из GaAs, в диапазоне температур 9-300 К. ... More
Add   Релаксация электрофизических параметров эпитаксиальных пленок КРТ при воздействии высокочастотного наносекундного объемного разряда в воздухе атмосферного давления
Authors: Григорьев, Денис Валерьевич | Ермаченков, Павел Андреевич | Тарасенко, Виктор Федотович | Шулепов, Михаил Александрович | Ерофеев, Михаил Владимирович | Рипенко, Василий Сергеевич | Дворецкий, Сергей Алексеевич | Михайлов, Николай Николаевич (физик) | Войцеховский, Александр Васильевич
Source: Известия высших учебных заведений. Физика. 2018. Т. 61, № 8/2. С. 132-136
Type: статьи в журналах
Date: 2018
Description: Представлены экспериментальные результаты исследования влияния высокочастотного наносекундного диффузного разряда в воздухе атмосферного давления на электрофизические свойства эпитаксиальных пленок КР ... More
Add   Electrical characteristics of epitaxial MCT after As+ implantation
Authors: Voytsekhovskiy, Alexander V. | Korotaev, A. G. | Lyapunov, D. V. | Dvoretsky, Sergei A. | Smirnov, P. | Izhnin, Igor I.
Source: Journal of Physics: Conference Series. 2017. Vol. 830. P. 012083 (1-6)
Type: статьи в журналах
Date: 2017
Description: In this work we studied the characteristics of MBE MCT films after the introduction of different energies As+ with different doses of irradiation. Some of the samples were subjected to post-implantati ... More
Add   Geometric and electronic structure of the Cs-doped Bi2Se3(0001) surface
Authors: Ernst, Arthur | Mohseni, Katayoon | Fulara, H. | Roy, S. | Castro, G. R. | Rubio-Zuazo, J. | Ryabishchenkova, Anastasiya G. | Kokh, Konstantin A. | Tereshchenko, Oleg E. | Otrokov, Mikhail M. | Aliev, Ziya S. | Babanly, Mahammad B. | Chulkov, Evgueni V. | Meyerheim, Holger L. | Parkin, S. S. P.
Source: Physical Review B. 2017. Vol. 95, № 20. P. 205429-1-205429-9
Type: статьи в журналах
Date: 2017
Description: Using surface x-ray diffraction and scanning tunneling microscopy in combination with first-principles calculations, we have studied the geometric and electronic structure of Cs-deposited Bi2Se3(0001) ... More
Add   Growth of epitaxial SiSn films with high Sn content for IR converters
Authors: Timofeev, V. A. | Kokhanenko, Andrey P. | Tuktamyshev, A. R. | Mashanov, V. I. | Loshkarev, I. D. | Novikov, Vladimir A. | Nikiforov, A. I.
Source: Russian physics journal. 2017. Vol. 60, № 2. P. 354-359
Type: статьи в журналах
Date: 2017
Description: Growth of SiSn compounds with a Sn content from 10 to 35% is studied. The morphology and surface structure of the SiSn layers are examined and the kinetic diagram of the morphological state of SiSn fi ... More

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