Электронная библиотека (репозиторий) Томского государственного университета
Matrosova, Anjela Yu.

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Add   ROBDDS application for finding the shortest transfer sequence of sequential circuit or only revealing existence of this sequence without deriving the sequence itself
Authors: Matrosova, Anjela Yu. | Andreeva, V. | Melnikov, A. V.
Source: Proceedings of IEEE East-West Design & Test Symposium (EWDTS'2016), Yerevan, Armenia, October 14-17, 2016. [S. l.], 2016. P. 513-516
Type: статьи в сборниках
Date: 2016
Add   Increasing Manufacturing Yield Using Partially Programmable Circuits with CLB implementation of Incompletely Specified Boolean Function of the Corresponding Sub-circuit
Authors: Matrosova, Anjela Yu. | Ostanin, Sergey A. | Kirienko, Irina E.
Source: Proceedings 2015 IEEE : 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS 2015), 22-24 April 2015, Belgrade, Serbia. Los Alamitos [et.al.], 2015. P. 267-270
Type: статьи в сборниках
Date: 2015
Add   Simplification of fully delay testable combinational circuits
Authors: Matrosova, Anjela Yu. | Mitrofanov, Evgenii V. | Shah, Toral
Source: Proceedings of the 21st IEEE International On-Line Testing Symposium Symposium (IOLTS), 6-8 July 2015, Athena Pallas Village, Elia, Halkidiki, Greece. [S. l.], 2015. P. 44-45
Type: статьи в сборниках
Date: 2015
Add   Robust PDFs testing of combinational circuits based on covering BDDs
Authors: Nikolaeva, E. A. | Ostanin, S. A. | Singh, V. | Matrosova, Anjela Yu.
Source: Вестник Томского государственного университета. Управление, вычислительная техника и информатика. 2012. № 3 (20). С. 129-138
Type: статьи в журналах
Date: 2012
Add   Selection of the flip-flops for partial enhanced scan techniques
Authors: Melnikov, A. V. | Mukhamedov, R. V. | Ostanin, S. A. | Singh, V. | Matrosova, Anjela Yu.
Source: Вестник Томского государственного университета. Управление, вычислительная техника и информатика. 2012. № 2 (19). С. 112-120
Type: статьи в журналах
Date: 2012
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