Authors: Matrosova, Anzhela Yu. | Provkin, V. А. | Tychinskiy, V. Z. | Nikolaeva, Ekaterina A. | Goshin, G. G.

Source: Russian physics journal. 2021. Vol. 63, № 12. P. 2178-2188

Type: статьи в журналах

Date: 2021

Description: Combinational circuit C composed of gates and its sub-circuit with set V of output nodes and set U of input nodes are considered. The set V consists of output nodes of fault gates of the circuit C (on ... More

Authors: Matrosova, Anzhela Yu. | Andreeva, V. V. | Tychinskiy, V. Z.

Source: 2021 IEEE East-West Design & Test Symposium (EWDTS), Batumi, Georgia, September 10-13, 2021 : proceedings. [S. l.], 2021. P. 252-255

Type: статьи в сборниках

Date: 2021

Description: It is known that if we have set of test pairs of neighbor Boolean vectors for robust testable PDF for each path considered in the given circuit, we may derive test sequence for these faults consisting ... More