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Source: Materials Chemistry and Physics. 2014. Vol. 146. P. 12-17
Type: статьи в журналах
Date: 2014
Source: International journal of modern physics B. 2021. Vol. 35, № 27. P. 2150273-1-2150273-14
Type: статьи в журналах
Date: 2021
Description:
GaSe nanoflakes on silicon substrates covered by SiO2 films are prepared by mechanical exfoliation from the bulk Bridgman-grown GaSe crystals using a scotch tape. The thickness of SiO2 films on Si sub
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Source: International Siberian Conference on Control and Communications (SIBCON–2015), Russia, Omsk, may 21-23, 2015 : proceedings. Omsk, 2015. P. [1-3]
Type: статьи в сборниках
Date: 2015
Source: Russian physics journal. 2021. Vol. 63, № 9. P. 1504-1509
Type: статьи в журналах
Date: 2021
Description:
GaSe and InSe nanolayers were obtained by mechanical exfoliation and physical vapor deposition methods on silicon substrates. Employing atomic force microscopy the surface morphology and thickness of
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Source: Effect of external influences on the strength and plasticity of metals and alloys : book of the International workshop articles, Russia-China, 15-20 September, 2015 [Barnaul-Belokurikha]. Barnaul, 2015. P. 175-176
Type: статьи в сборниках
Date: 2015
Source: Journal of optics. 2017. Vol. 19, № 11. P. 115503 (1-7)
Type: статьи в журналах
Date: 2017
Description:
Terahertz wave generation through optical rectification of femtosecond laser pulses and its detection in GaSe and GaSe1−x S x crystals with a relatively low (x = 0.04) and high (x = 0.29) content of s
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Source: Опто-, наноэлектроника, нанотехнологии и микросистемы : труды 18-й Международной конференции. Ульяновск, 2015. С. 99
Type: статьи в сборниках
Date: 2015
Source: Russian physics journal. 2015. Vol. 58, № 8. P. 1181-1185
Type: статьи в журналах
Date: 2015
Description:
Thin amorphous SiO2, TiO2, and Ga2O3 films were deposited on the surface of GaSe crystals by thermal and magnetron sputtering. It was found that under different technological conditions, the SiO2 and
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