Электронная библиотека (репозиторий) Томского государственного университета
Eremeev, Sergey V. | Bakulin, Alexander V.

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Source: Applied physics letters. 2015. Vol. 107, № 12. P. 123506-1-123506-5
Type: статьи в журналах
Date: 2015
Description: In this letter, we present electrical and magnetic characteristics of HfO2-based metal-oxide-semiconductor capacitors (MOSCAPs), along with the effect of pseudomorphic Si as a passivating interlayer o ... More
Source: Surface science. 2013. Vol. 615. P. 97-102
Type: статьи в журналах
Date: 2013
Source: The Journal of Physical Chemistry C. 2013. Vol. 117, № 19. P. 9723-9733
Type: статьи в журналах
Date: 2013
Source: The Journal of Physical Chemistry C. 2012. Vol. 116, № 15. P. 8535-8540
Type: статьи в журналах
Date: 2012
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