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Authors:
ereshchenko, Oleg E. |
Eremeev, Sergey V. |
Maurin, I. |
Bakulin, Alexander V. |
Kulkova, Svetlana E. |
Aksenov, Maxim S. |
Preobrazhenskii, V. V. |
Putyato, M. A. |
Semyagin, B. R. |
Golyashov, V. A. |
Dmitriev, D. V. |
Toropov, A. I. |
Gutakovskii, A. K. |
Khandarkhaeva, S. E. |
Prosvirin, I. P.
Source: Applied physics letters. 2015. Vol. 107, № 12. P. 123506-1-123506-5
Type: статьи в журналах
Date: 2015
Description:
In this letter, we present electrical and magnetic characteristics of HfO2-based metal-oxide-semiconductor capacitors (MOSCAPs), along with the effect of pseudomorphic Si as a passivating interlayer o
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Source: Surface science. 2013. Vol. 615. P. 97-102
Type: статьи в журналах
Date: 2013
Source: The Journal of Physical Chemistry C. 2013. Vol. 117, № 19. P. 9723-9733
Type: статьи в журналах
Date: 2013
Source: The Journal of Physical Chemistry C. 2012. Vol. 116, № 15. P. 8535-8540
Type: статьи в журналах
Date: 2012