Testing digital circuits: studying the increment of the number of states and estimating the fault coverage

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DOI Доступ к ресурсу на сайте издателя			10.1109/EDM.2018.8435051

Title: Testing digital circuits: studying the increment of the number of states and estimating the fault coverage
Creator: Laputenko, Andrey V
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López, Jorge
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Kushik, Natalia G.
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Vinarskii, Evgenii
Date: 2018
DOI: 10.1109/EDM.2018.8435051
Description: Testing of digital circuits is very important,

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collection(s): Радиофизический факультет
Identifier: смотреть в электронном каталоге НБ ТГУ
Type: статьи в сборниках
Source: 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM 2018), Erlagol, Altai Republic, 29 June - 3 July, 2018 : proceedings. [S. l.], 2018. P. 220-224
Language: eng

Created: 28-06-2019

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Радиофизический факультет Testing digital circuits: studying the increment of the number of states and estimating the fault coverage