Authors: Shvets, Vasiliy | Ikusov, Danil | Uzhakov, Ivan | Dvoretsky, Sergei A. | Mynbaev, Karim D. | Dluzewski, Piotr | Morgiel, Jerzy | Świątek, Zbigniew | Bonchyk, A. Yu. | Mikhailov, Nikolay N. | Izhnin, Igor I.

Source: Physica status solidi B. 2020. Vol. 257, № 5. P. 1900598 (1-5)

Type: статьи в журналах

Date: 2020

Description: Transmission electron microscopy (TEM) is used for the study of interfaces in two HgTe/HgCdTe single quantum-well (QW) structures grown by molecular beam epitaxy on GaAs substrates. The studies are co ... More

Authors: Izhnin, Igor I. | Mynbaev, Karim D. | Syvorotka, I. I. | Korotaev, Alexander G. | Voytsekhovskiy, Alexander V. | Fitsych, Olena I. | Varavin, Vasilii S. | Marin, Denis V. | Bonchyk, A. Yu. | Mikhailov, Nikolay N. | Yakushev, Maxim V. | Świątek, Zbigniew | Morgiel, Jerzy | Jakiela, Rafal | Savytskyy, Hrygory V.

Source: Applied nanoscience. 2020. Vol. 10, № 12. P. 4971-4976

Type: статьи в журналах

Date: 2020

Description: Optical reflectance and bright-field and high-resolution transmission electron microscopy studies of radiation damage induced