Электронная библиотека (репозиторий) Томского государственного университета
Ahlawat, Satyadev

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Add   A high performance scan flip-flop design for serial and mixed mode scan test
Authors: Tudu, Jaynarayan | Matrosova, Anzhela Yu. | Singh, Virendra | Ahlawat, Satyadev
Source: IEEE transactions on device and materials reliability. 2018. Vol. 18, № 2. P. 321-331
Type: статьи в журналах
Date: 2018
Description: Over the years, serial scan design has become the de-facto design for testability technique. The ease of testing and high test coverage has made it gain widespread industrial acceptance. However, ther ... More
Add   A high performance scan flip-flop design for serial and mixed mode scan test
Authors: Ahlawat, Satyadev | Matrosova, Anjela Yu. | Singh, Virendra | Tudu, Jaynarayan
Source: 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS), 4-6 July 2016, Hotel Eden Roc, Sant Feliu de Guixols, Catalunya, Spain. [S. l.], 2016. P. 233-238
Type: статьи в сборниках
Date: 2016
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