Электронная библиотека (репозиторий) Томского государственного университета
Voytsekhovskiy, Alexander V. | МДП-структуры | электрофизические характеристики

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Add   Description of electrophysical characteristics for MIS-structures with CdHgTe-based quantum wells under the 8–300 K
Authors: Voytsekhovskiy, Alexander V. | Gorn, Dmitriy Igorevich
Source: Известия высших учебных заведений. Физика. 2013. Т. 56, № 10/3. С. 206-208
Type: статьи в журналах
Date: 2013
Add   Investigation of the effect of soft X-ray radiation on the electrophysical characteristics of epitaxial layers n-Hg1-xCdxTe
Authors: Sredin, V. G. | Anan'in, O. B. | Melekhov, A. P. | Nesmelov, Sergey N. | Dzyadukh, Stanislav M. | Yurchak, V. A. | Voytsekhovskiy, Alexander V.
Source: 6th International congress on energy fluxes and radiation effects (EFRE 2018), September 16-22, 2018, Tomsk, Russia : abstracts. Tomsk, 2018. P. 353
Type: статьи в сборниках
Date: 2018
Add   Electrophysical characteristics of the pentacene-based MIS structures with a SiO2 insulator
Authors: Voytsekhovskiy, Alexander V. | Nesmelov, Sergey N. | Dzyadukh, Stanislav M. | Kopylova, Tatyana N. | Degtyarenko, Konstantin M. | Chernikov, E. V. | Kalygina, V. M. | Novikov, Vadim A.
Source: Russian physics journal. 2019. Vol. 62, № 1. P. 90-99
Type: статьи в журналах
Date: 2019
Description: In a wide range of frequencies and temperatures, the admittance of MIS structures based on pentacene organic films, formed by thermal evaporation in vacuum on SiO2 and SiO2/Ga2O3 substrates, was exper ... More
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