https://vital.lib.tsu.ru/vital/access/manager/Index en-us 5 Characterisation of the HEXITEC4S X-ray spectroscopic imaging detector incorporating through-silicon via (TSV) technology https://vital.lib.tsu.ru/vital/access/manager/Repository/koha:000997249 Mon 06 Mar 2023 11:23:34 KRAT ]]>