https://vital.lib.tsu.ru/vital/access/manager/Index en-us 5 Electron mobility-lifetime and resistivity mapping of GaAs:Cr wafers https://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000616077 Wed 29 Nov 2017 10:08:59 KRAT ]]> GaAs:Cr X-ray sensors noise characteristics investigation by means of amplitude spectrum analysis https://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000628746 Wed 20 Jun 2018 10:50:14 KRAT ]]> Characterization of GaAs:Cr sensors using the charge-integrating JUNGFRAU readout chip https://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000673870 Tue 28 Jan 2020 09:50:23 KRAT ]]> The influence of contact material and its fabrication on X-ray HR-GaAs:Cr sensor noise characteristics https://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000673869 Tue 28 Jan 2020 09:50:23 KRAT ]]>