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Source: Russian physics journal. 2021. Vol. 63, № 12. P. 2178-2188
Type: статьи в журналах
Date: 2021
Description:
Combinational circuit C composed of gates and its sub-circuit with set V of output nodes and set U of input nodes are considered. The set V consists of output nodes of fault gates of the circuit C (on
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Source: Вестник Томского государственного университета. Управление, вычислительная техника и информатика. 2017. № 41. С. 61-68
Type: статьи в журналах
Date: 2017
Description:
This paper presents a fault-tolerant synchronous sequential circuit design based on self-checking system with low overhead. The scheme has only one self-checking sequential circuit, normal (unprotecte
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