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Source: Proceedings of IEEE East-West Design & Test Symposium (EWDTS'2018), Kazan, Russia, September 14-17, 2018. [S. l.], 2018. P. 645-648
Type: статьи в сборниках
Date: 2018
Source: 2018 IEEE 24th International Symposium on On-Line Testing and Robust System Design (IOLTS 2018), 2-4 July 2018, Spain. [S. l.], 2018. P. 240-242
Type: статьи в сборниках
Date: 2018
Description:
Performance of VLSI is, first of all, its high operation