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Source: Вестник Томского государственного университета. Управление, вычислительная техника и информатика. 2017. № 39. P. 85-93
Type: статьи в журналах
Date: 2017
Description:
Fully delay testable circuits obtained by covering ROBDD nodes with Invert-AND-OR sub-circuits and Invert-ANDXOR sub-circuits implementing Shannon decomposition formula are considered. Algorithms of f
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Source: Proceedings of the 21st IEEE International On-Line Testing Symposium Symposium (IOLTS), 6-8 July 2015, Athena Pallas Village, Elia, Halkidiki, Greece. [S. l.], 2015. P. 44-45
Type: статьи в сборниках
Date: 2015