Электронная библиотека (репозиторий) Томского государственного университета
вредоносные подсхемы | Ostanin, Sergey A. | 2017

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Source: Proceedings of 2017 IEEE East-West Design & Test Symposium (EWDTS), Novi Sad, Serbia, September 27 – October 2, 2017. [S. l.], 2017. P. 137-140
Type: статьи в сборниках
Date: 2017
Description: A technique of finding a set of sequential circuit
Source: 2017 European Conference on Circuit Theory and Design (ECCTD), September 4-6, 2017, Catania, Italy. [S. l.], 2017. P. [1-4]
Type: статьи в сборниках
Date: 2017
Description: Inserting malicious sub-circuits that may cause a
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