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Source: 2021 IEEE East-West Design & Test Symposium (EWDTS), Batumi, Georgia, September 10-13, 2021 : proceedings. [S. l.], 2021. P. 238-241
Type: статьи в сборниках
Date: 2021
Description:
We consider combination circuit C and some its nodes that faults are detected on the last stages of circuit fabrication. Besides, injections of Trojan Circuits (TCs) in certain circuit C lines may be
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Source: 2020 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 22nd edition, 21st -23rd May, Cluj-Napoca, Romania : proceedings. [S. l.], 2020. P. 3-6
Type: статьи в сборниках
Date: 2020
Description:
We consider a combination circuit (the combinational part of a sequential circuit) and some nodes which faults are detected on the last stages of the circuit fabrication. Besides, injections of Trojan
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