Электронная библиотека (репозиторий) Томского государственного университета
2017

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Add   Electrical characteristics of epitaxial MCT after As+ implantation
Authors: Voytsekhovskiy, Alexander V. | Korotaev, A. G. | Lyapunov, D. V. | Dvoretsky, Sergei A. | Smirnov, P. | Izhnin, Igor I.
Source: Journal of Physics: Conference Series. 2017. Vol. 830. P. 012083 (1-6)
Type: статьи в журналах
Date: 2017
Description: In this work we studied the characteristics of MBE MCT films after the introduction of different energies As+ with different doses of irradiation. Some of the samples were subjected to post-implantati ... More
Add   Geometric and electronic structure of the Cs-doped Bi2Se3(0001) surface
Authors: Ernst, Arthur | Mohseni, Katayoon | Fulara, H. | Roy, S. | Castro, G. R. | Rubio-Zuazo, J. | Ryabishchenkova, Anastasiya G. | Kokh, Konstantin A. | Tereshchenko, Oleg E. | Otrokov, Mikhail M. | Aliev, Ziya S. | Babanly, Mahammad B. | Chulkov, Evgueni V. | Meyerheim, Holger L. | Parkin, S. S. P.
Source: Physical Review B. 2017. Vol. 95, № 20. P. 205429-1-205429-9
Type: статьи в журналах
Date: 2017
Description: Using surface x-ray diffraction and scanning tunneling microscopy in combination with first-principles calculations, we have studied the geometric and electronic structure of Cs-deposited Bi2Se3(0001) ... More
Add   Growth of epitaxial SiSn films with high Sn content for IR converters
Authors: Timofeev, V. A. | Kokhanenko, Andrey P. | Tuktamyshev, A. R. | Mashanov, V. I. | Loshkarev, I. D. | Novikov, Vladimir A. | Nikiforov, A. I.
Source: Russian physics journal. 2017. Vol. 60, № 2. P. 354-359
Type: статьи в журналах
Date: 2017
Description: Growth of SiSn compounds with a Sn content from 10 to 35% is studied. The morphology and surface structure of the SiSn layers are examined and the kinetic diagram of the morphological state of SiSn fi ... More
Add   Influence of a high-frequency pulsed nanosecond diffusion discharge in the nitrogen atmosphere on the electrical characteristics of a CdHgTe epitaxial films
Authors: Voytsekhovskiy, Alexander V. | Korotaev, A. G. | Lyapunov, D. V. | Lozovoy, Kirill A. | Tarasenko, Viktor Fedotovich | Shulepov, Mikhail A. | Erofeev, Mikhail V. | Ripenko, V. | Dvoretsky, Sergei A. | Grigoryev, Denis V. | Mikhailov, N. N.
Source: Journal of Physics: Conference Series. 2017. Vol. 830. P. 012082 (1-4)
Type: статьи в журналах
Date: 2017
Description: The effect of a high-frequency nanosecond volume discharge forming in an inhomogeneous electrical field at atmospheric pressure on the CdHgTe (CMT) epitaxial films is studied. The measurement of the e ... More
Add   Some properties of near-surface layer of graded-gap MBE HgCdTe after boron ion implantation
Authors: Voytsekhovskiy, Alexander V. | Dzyadukh, Stanislav M. | Izhnin, Igor I. | Nesmelov, Sergey N.
Source: Journal of Physics: Conference Series. 2017. Vol. 830. P. 012081 (1-4)
Type: статьи в журналах
Date: 2017
Description: The effect of ion implantation of boron ions with an energy of 100 keV and a dose of (1-6)×1015 cm-2 in the MBE HgCdTe films on the characteristics of the MIS structures based on these films was inves ... More
Add   Концентрация основных носителей заряда в приповерхностном варизонном слое МЛЭ n(p)-HgCdTe, определенная из емкостных измерений
Authors: Несмелов, Сергей Николаевич | Войцеховский, Александр Васильевич | Дзядух, Станислав Михайлович
Source: Известия высших учебных заведений. Физика. 2017. Т. 60, № 12/2. С. 198-201
Type: статьи в журналах
Date: 2017
Description: Определены значения концентраций основных носителей заряда в приповерхностных варизонных слоях полупроводника из измерений адмиттанса МДП-структур на основе n ( p )-HgCdTe, выращенного методом молекул ... More
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