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Source: Proceedings of IEEE East-West Design & Test Symposium (EWDTS'2018), Kazan, Russia, September 14-17, 2018. [S. l.], 2018. P. 256-261
Type: статьи в сборниках
Date: 2018
Description:
In this paper, we discuss how the robustness of the
Source: 18th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices : proceedings, Erlagol, Altai Republic, 29 June - 3 July, 2017. Novosibirsk, 2017. P. 151-154
Type: статьи в сборниках
Date: 2017
Description:
In this paper we discuss how the web-service