Please be patient while the object screen loads.
Description | Size | Format | ||
---|---|---|---|---|
X-ray microbeam characterisation of crystalline defects in small pixel GaAs:Cr detectors | 3 MB | Adobe Acrobat PDF | View Details | Download |
DOI Доступ к ресурсу на сайте издателя | 10.1016/j.nima.2021.165207 |