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Source: Semiconductors. 2015. Vol. 49, № 3. P. 309-312
Type: статьи в журналах
Date: 2015
Description:
Atomic-force microscopy is used to investigate the distribution of the contact-potential difference (surface potential) in Cd x Hg1 − x Te epitaxial films grown by molecular-beam epitaxy. Modification
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Source: 12th International Conference "Gas Discharge Plasmas and Their Applications" GDP 2015, September 6-11, 2015, Tomsk, Russia : Abstracts. Tomsk, 2015. P. 210
Type: статьи в сборниках
Date: 2015