A novel data processing algorithm in thermal property measurement and defect detection by using one-sided active infrared thermography

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A novel data processing algorithm in thermal property measurement and defect detection by using one-sided active infrared thermography	487 KB	Adobe Acrobat PDF	Read	Download
DOI Доступ к ресурсу на сайте издателя			10.1117/12.2175645

Title: A novel data processing algorithm in thermal property measurement and defect detection by using one-sided active infrared thermography
Creator: Vavilov, Vladimir P.
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Shiryaev, V. V.
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Chulkov, A. O.
Contributor: Томский государственный университет Механико-математический факультет Кафедра физической и вычислительной механики
Date: 2015
DOI: 10.1117/12.2175645
Description: The proposed algorithm is based on the analysis of an artificial front-surface pixel-based function which includes

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collection(s): Механико-математический факультет
Identifier: смотреть в электронном каталоге НБ ТГУ
Type: статьи в журналах
Source: Proceedings of SPIE. 2015. Vol. 9485 : Thermosense: Thermal Infrared Applications XXXVII. P. 94850V-1-94850V-7
Language: eng

Created: 23-05-2016

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Механико-математический факультет A novel data processing algorithm in thermal property measurement and defect detection by using one-sided active infrared thermography