Detection of hard-to-detect stuck-at faults and generation of their tests based on testability functions

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Detection of hard-to-detect stuck-at faults and generation of their tests based on testability functions	200 KB	Adobe Acrobat PDF	Read	Download
DOI Доступ к ресурсу на сайте издателя			10.1109/AQTR.2018.8402703

Title: Detection of hard-to-detect stuck-at faults and generation of their tests based on testability functions
Creator: Golubeva, O.
Date: 2018
DOI: 10.1109/AQTR.2018.8402703
Description: An efficient method is proposed for detecting hard- to-detect stuck-at faults of combinational circuits and generating all tests or one test vector for them. The method is based on the previously proposed efficient methods of constructing the ODNF and ROBDD representations of the observability and stuck-at fault detection Boolean functions, corresponding to a line of the combinational circuit.

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collection(s): Институт прикладной математики и компьютерных наук (c 01.09.2017 г.)
Identifier: смотреть в электронном каталоге НБ ТГУ
Type: статьи в сборниках
Source: 2018 IEEE International conference on automation, quality and testing, robotics (AQTR) : THETA 21st edition, 24th-26th May, Cluj-Napoca, Romania : proceedings. [S. l.], 2018. P. [1-5]
Language: eng

Created: 11-03-2019

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Институт прикладной математики и компьютерных наук (c 01.09.2017 г.) Detection of hard-to-detect stuck-at faults and generation of their tests based on testability functions