Investigation of surface potential in the V-defect region of MBE CdxHg1−xTe film

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Investigation of surface potential in the V-defect region of MBE Cd x Hg1 − x Te film	1 MB	Adobe Acrobat PDF	Read	Download
DOI Доступ к ресурсу на сайте издателя			10.1134/S106378261503015X

Title: Investigation of surface potential in the V-defect region of MBE CdxHg1−xTe film
Creator: Novikov, Vadim A.
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Grigoryev, Denis V.
Date: 2015
DOI: 10.1134/S106378261503015X
Description: Atomic-force microscopy is used to investigate the distribution of the contact-potential difference (surface potential) in Cd x Hg1 − x Te epitaxial films grown by molecular-beam epitaxy. Modification of the solid-solution composition near the V-defect results in a variation in the contact-potential difference. It is shown that the solid-solution composition varies by ∼0.05 (2.5 at %) towards increasing mercury content in the V-defect region, and a region of mercury depletion by 0.36 at % is observed at the V-defect periphery. From analysis of the surface-potential distribution, it is shown that the Cd x Hg1 − x Te epitaxial film contains unform V-defects with a diameter less than 1 μm in addition to macroscopic V-defects.