https://vital.lib.tsu.ru/vital/access/manager/Index ${session.getAttribute("locale")} 5 Electron mobility-lifetime and resistivity mapping of GaAs:Cr wafers https://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000616077 Wed 29 Nov 2017 10:08:59 KRAT ]]> Characterization of 4 inch GaAs:Cr wafers https://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000616083 Wed 29 Nov 2017 10:02:00 KRAT ]]> The influence of contact material and its fabrication on X-ray HR-GaAs:Cr sensor noise characteristics https://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000673869 Tue 28 Jan 2020 09:50:23 KRAT ]]> Influence of temperature on the energy resolution of sensors based on HR GaAs:Cr https://vital.lib.tsu.ru/vital/access/manager/Repository/koha:000927189 Thu 26 Jan 2023 09:56:16 KRAT ]]> Characterisation of the HEXITEC4S X-ray spectroscopic imaging detector incorporating through-silicon via (TSV) technology https://vital.lib.tsu.ru/vital/access/manager/Repository/koha:000997249 Mon 06 Mar 2023 11:23:34 KRAT ]]>