Электронная библиотека (репозиторий) Томского государственного университета
v-дефекты | Novikov, Vadim A.

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Add   Electrical properties of the V-defects of epitaxial HgCdTe
Authors: Novikov, Vadim A. | Bezrodnyy, Dmitriy A. | Voytsekhovskiy, Alexander V. | Dvoretsky, Sergei A. | Mikhailov, Nikolay N. | Grigoryev, Denis V.
Source: Journal of electronic materials. 2017. Vol. 46, № 7. P. 4435-4438
Type: статьи в журналах
Date: 2017
Description: The manufacturing process of wide-band-gap matrix photodetector devices and miniaturization of their individual pixels gave rise to increased demands on the material quality and research methods. In t ... More
Add   Electrical properties of the V-defects of epitaxial HgCdTe
Authors: Novikov, Vadim A. | Bezrodnyy, Dmitriy A. | Voytsekhovskiy, Alexander V. | Dvoretsky, Sergei A. | Mikhailov, Nikolay N. | Yakushev, Maxim V. | Grigoryev, Denis V.
Source: 17th International Conference on II-VI Compounds and Related Materials, Paris, 13-18 September 2015 : conference book. [S. l.], 2015. P. 345
Type: статьи в сборниках
Date: 2015
Add   Investigation of surface potential in the V-defect region of MBE CdxHg1−xTe film
Authors: Novikov, Vadim A. | Grigoryev, Denis V.
Source: Semiconductors. 2015. Vol. 49, № 3. P. 309-312
Type: статьи в журналах
Date: 2015
Description: Atomic-force microscopy is used to investigate the distribution of the contact-potential difference (surface potential) in Cd x Hg1 − x Te epitaxial films grown by molecular-beam epitaxy. Modification ... More
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