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Description | Size | Format | ||
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Investigation of the effect of thermal annealing on the electrical properties of the near-surface layer of MBE n-HgCdTe using MIS techniques | 1 MB | Adobe Acrobat PDF | View Details | Download |
DOI Доступ к ресурсу на сайте издателя | 10.1007/s11664-020-08005-0 |