Электронная библиотека (репозиторий) Томского государственного университета
Pchelyakov, Oleg P. | Nikiforov, Alexander I.

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Add   Formation of Ge/Si nanoscale structures at different growth conditions by molecular beam epitaxy
Authors: Timofeev, V. A. | Zinovyev, V. A. | Teys, S. A. | Pchelyakov, Oleg P. | Nikiforov, Alexander I.
Source: Journal of nanoelectronics and optoelectronics. 2015. Vol. 10, № 1. P. 99-103
Type: статьи в журналах
Date: 2015
Description: Nanoscale structures such as quantum wells, quantum wires, quantum dots and quantum fortresses are obtained by molecular beam epitaxy (MBE) technique. Various surface morphology was controlled by chan ... More
Add   Surface structure of thin pseudomorphous GeSi layers
Authors: Nikiforov, Alexander I. | Timofeev, V. F. | Pchelyakov, Oleg P.
Source: Applied surface science. 2015. Vol. 354, Part B. P. 450-452
Type: статьи в журналах
Date: 2015
Description: Reflection high-energy electron diffraction (RHEED) was used to study the evolution of thin GexSi1−x film surface superstructures s in the course of molecular beam epitaxy. The (2 × N) superstructure ... More
Add   Heterostructures with self-organized quantum dots of Ge on Si for optoelectronic devices
Authors: Voytsekhovskiy, Alexander V. | Kokhanenko, Andrey P. | Satdarov, Vadim G. | Pchelyakov, Oleg P. | Nikiforov, Alexander I. | Lozovoy, Kirill A.
Source: Opto-electronics review. 2014. Vol. 22, № 3. P. 171-177
Type: статьи в журналах
Date: 2014
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