The paper presents a method for parameter identification of dual-energy X-ray imaging. This method is based on pre-calculated or experimentally obtained dependencies between the right sides of the system of two integral parametric equations and two required parameters within the ranges interesting to a customer. This method is characterized by a high processing speed depending on the speed of random access memory. Thus, it is used in different implementations of dual-energy X-ray imaging, namely digital radiography and computed tomography.