Authors: Novikov, Vadim A. | Bezrodnyy, Dmitriy A. | Voytsekhovskiy, Alexander V. | Dvoretsky, Sergei A. | Mikhailov, Nikolay N. | Grigoryev, Denis V.

Source: Journal of electronic materials. 2017. Vol. 46, № 7. P. 4435-4438

Type: статьи в журналах

Date: 2017

Description: The manufacturing process of wide-band-gap matrix photodetector devices and miniaturization of their individual pixels gave rise to increased demands on the material quality and research methods. In t ... More

Authors: Novikov, Vadim A. | Grigoryev, Denis V.

Source: Semiconductors. 2015. Vol. 49, № 3. P. 309-312

Type: статьи в журналах

Date: 2015

Description: Atomic-force microscopy is used to investigate the distribution of the contact-potential difference (surface potential) in Cd x Hg1 − x Te epitaxial films grown by molecular-beam epitaxy. Modification ... More