Электронная библиотека (репозиторий) Томского государственного университета
Voytsekhovskiy, Alexander V. | Bonchyk, A. Yu. | Marin, Denis V. | 2020

Add to Quick Collection   All 2 Results

Showing items 1 - 2 of 2.
  • «
  • 1
  • »
Sort:
 Add All Items to Quick Collection
Source: Infrared physics and technology. 2020. Vol. 109. P. 103388 (1-7)
Type: статьи в журналах
Date: 2020
Description: Optical reflectance in the visible wavelength range, transmission electron microscopy, and the Hall-effect measurements with mobility spectrum analysis have been used for the direct comparison of the ... More
Source: Applied nanoscience. 2020. Vol. 10, № 12. P. 4971-4976
Type: статьи в журналах
Date: 2020
Description: Optical reflectance and bright-field and high-resolution transmission electron microscopy studies of radiation damage induced
  • «
  • 1
  • »
^