Электронная библиотека (репозиторий) Томского государственного университета

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Source: Proceedings of IEEE East-West Design & Test Symposium (EWDTS'2018), Kazan, Russia, September 14-17, 2018. [S. l.], 2018. P. 358-363
Type: статьи в сборниках
Date: 2018
Description: Software Defined Networking (SDN) platforms are
Source: 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM 2018), Erlagol, Altai Republic, 29 June - 3 July, 2018 : proceedings. [S. l.], 2018. P. 220-224
Type: статьи в сборниках
Date: 2018
Description: Testing of digital circuits is very important,
Source: Novosibirsk, 2017. P. 184-189
Type: статьи в сборниках
Date: 2017
Description: Testing digital circuits is crucial for guaranteeing the correct and reliable functioning of electronic devices. Deriving high quality test suites to check the correctness of such devices is an import ... More
Source: 2016 IEEE International Conference on Software Quality, Reliability and Security (QRS), 1-3 August 2016, Vienna, Austria. [S. l.], 2016. P. 315-322
Type: статьи в сборниках
Date: 2016
Source: ENASE 2016 : proceedings of the 11th International conference on evaluation of novel software approaches to software engineering, Rome, Italy, April 27-28, 2016. Setúbal, 2016. P. 282-287
Type: статьи в сборниках
Date: 2016
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