Authors: Bonchyk, A. Yu. | Savytskyy, Hrygory V. | Dvoretsky, Sergei A. | Mikhailov, Nikolay N. | Yakushev, Maxim V. | Świątek, Zbigniew | Morgiel, Y. | Izhnin, Igor I. | Voytsekhovskiy, Alexander V. | Korotaev, A. G. | Mynbaev, Karim D. | Fitsych, Olena I. | Varavin, Vasilii S.

Source: Applied nanoscience. 2020. Vol. 10, № 8. P. 2867-2871

Type: статьи в журналах

Date: 2020

Description: Bright-field and high-resolution transmission electron microscopy and microdiffraction have been used for the study of defects in two HgTe/HgCdTe single quantum well (QW) structures grown by molecular ... More

Authors: Fitsych, Olena I. | Świątek, Zbigniew | Morgiel, Y. | Bonchyk, A. Yu. | Savytskyy, Hrygory V. | Mynbaev, Karim D. | Voytsekhovskiy, Alexander V. | Korotaev, Alexander G. | Yakushev, Maxim V. | Marin, Denis V. | Varavin, Vasilii S. | Dvoretsky, Sergei A. | Izhnin, Igor I.

Source: Opto-electronics review. 2019. Vol. 27, № 1. P. 14-17

Type: статьи в журналах

Date: 2019

Description: Effect of annealing on the structural properties of arsenic-implanted mercury cadmium telluride film grown by molecular beam epitaxy was studied with the use of transmission electron microscopy and op ... More

Authors: Izhnin, Igor I. | Voytsekhovskiy, Alexander V. | Korotaev, A. G. | Mynbaev, Karim D. | Varavin, Vasilii S. | Dvoretsky, Sergei A. | Mikhailov, Nikolay N. | Yakushev, Maxim V. | Bonchyk, A. Yu. | Fitsych, Olena I. | Savytskyy, Hrygory V. | Świątek, Zbigniew

Source: Russian physics journal. 2018. Vol. 60, № 10. P. 1752-1757

Type: статьи в журналах

Date: 2018

Description: Complex studies of the defect structure of arsenic-implanted (with the energy of 190 keV) Cd x Hg 1–x Te (x = 0.22) films grown by molecular-beam epitaxy are carried out. The investigations were perfo ... More

Authors: Izhnin, Igor I. | Korotaev, A. G. | Fitsych, Olena I. | Bonchyk, Oleksandr Yu. | Savytskyy, Hrygory V. | Mynbaev, Karim D. | Varavin, Vasilii S. | Dvoretsky, Sergei A. | Yakushev, Maxim V. | Voytsekhovskiy, Alexander V. | Jakiela, Rafal | Trzyna, Malgorzata

Source: EPJ Web of Conferences. 2017. Vol. 133. P. 01001 (1-4)

Type: статьи в журналах

Date: 2017

Description: Defect structure of arsenic-implanted Hg1-xCdxTe films (x=0.23–0.30) grown with molecular-beam epitaxy on Si substrates was investigated with the use of optical methods and by studying the electrical ... More

Authors: Bonchyk, A. Yu. | Savytskyy, Hrygory V. | Fitsych, Olena I. | Voytsekhovskiy, Alexander V. | Izhnin, Igor I. | Mohylyak, I. A.

Source: XV International conference on physics and technology of thin films and nanosystems, Ivanо-Frankivsk, May, 11-16, 2015 : book of abstracts. Ivano-Frankivsk, 2015. P. 258

Type: статьи в сборниках

Date: 2015